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Lee, Hoon Jeong; Hofelmann, Ariana B.; Lin, Yida; Thon, Susanna M. (, 2022 IEEE 49th Photovoltaics Specialists Conference (PVSC))Numerous characterization techniques have been developed over the last century, which have advanced progress on the development of a variety of photovoltaic technologies. However, this multitude of techniques leads to increasing experimental costs and complexity. It would be useful to have an approach that does not require the time commitment or operation costs to directly learn and implement every new measurement technique. Herein, we explore several machine learning (ML) models that output complex materials parameters, such as electronic trap state density, solely using illuminated current-voltage curves. This greatly reduces both the complexity and cost of the characterization process. Current-voltage curves were chosen as the only input to our models because this type of measurement is relatively simple to perform and most photovoltaic research labs already collect this information on all devices. We compare several different ML network architectures, all of which are trained on experimental data from PbS colloidal quantum dot thin film solar cells. We predict values for underlying materials parameters and compare them to experimentally measured results.more » « less
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